Dr. Robert W. Herrick
Sr. Reliability Engineer at
SPIE Involvement:
Conference Chair | Author
Area of Expertise:
VCSEL Reliability , Semiconductor Laser Reliability , Optoelectronic Reliability , VCSEL Failure analysis , Semiconductor Laser Failure Analysis , Control of Electrostatic Discharge
Profile Summary

Have worked in most areas of semiconductor laser fabrication and test, including modeling, design, fabrication, process development, reliability testing, and failure analysis. Ph.D. in VCSEL reliability and failure analysis; have published many of the papers available on those subjects. Have worked for most of the US VCSEL suppliers, including HP/Agilent (now Avago), Finisar (formerly Honeywell / AOCD), Emcore, and JDSU (formerly Picolight). Primarly expertise in semiconductor laser reliability testing and failure analysis; secondary expertise in fiber optic transceiver reliability testing and in electrostatic discharge control.
Publications (15)

PROCEEDINGS ARTICLE | September 18, 2018
Proc. SPIE. 10771, Quantum Communications and Quantum Imaging XVI
KEYWORDS: Transparency, Gallium arsenide, Silicon, Doping, Quantum dots, Semiconductor lasers, Silicon photonics, Gallium, Quantum dot lasers, Absorption

PROCEEDINGS ARTICLE | March 13, 2013
Proc. SPIE. 8639, Vertical-Cavity Surface-Emitting Lasers XVII
KEYWORDS: Oxides, Sensors, Dielectrics, Reliability, Corrosion, Transmission electron microscopy, Humidity, Epoxies, Vertical cavity surface emitting lasers, Failure analysis

PROCEEDINGS ARTICLE | June 16, 2004
Proc. SPIE. 5364, Vertical-Cavity Surface-Emitting Lasers VIII
KEYWORDS: Oxides, Transceivers, Mirrors, Manufacturing, Reliability, Electroluminescence, Transmission electron microscopy, Vertical cavity surface emitting lasers, Semiconducting wafers, Failure analysis

PROCEEDINGS ARTICLE | June 17, 2003
Proc. SPIE. 4994, Vertical-Cavity Surface-Emitting Lasers VII
KEYWORDS: Semiconductors, Oxides, Reliability, Electroluminescence, Transmission electron microscopy, Humidity, Vertical cavity surface emitting lasers, Semiconducting wafers, Failure analysis, Oxidation

PROCEEDINGS ARTICLE | June 17, 2003
Proc. SPIE. 4994, Vertical-Cavity Surface-Emitting Lasers VII
KEYWORDS: Oxides, Contamination, Metals, Reliability, Electroluminescence, Transmission electron microscopy, Optical inspection, Humidity, Vertical cavity surface emitting lasers, Failure analysis

PROCEEDINGS ARTICLE | June 4, 2002
Proc. SPIE. 4649, Vertical-Cavity Surface-Emitting Lasers VI
KEYWORDS: Packaging, Oxides, Transceivers, Manufacturing, Reliability, Resistance, Vertical cavity surface emitting lasers, Data communications, Semiconducting wafers, Temperature metrology

Showing 5 of 15 publications
Conference Committee Involvement (2)
Testing and Reliability of Optoelectronic Devices
22 January 2002 | San Jose, California, United States
Test and Measurement Applications of Optoelectronic Devices
21 January 2002 | San Jose, California, United States
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