Dr. Robert W. Herrick
SPIE Involvement:
Area of Expertise:
VCSEL Reliability , Semiconductor Laser Reliability , Optoelectronic Reliability , VCSEL Failure analysis , Semiconductor Laser Failure Analysis , Control of Electrostatic Discharge
Profile Summary

Have worked in most areas of semiconductor laser fabrication and test, including modeling, design, fabrication, process development, reliability testing, and failure analysis. Ph.D. in VCSEL reliability and failure analysis; have published many of the papers available on those subjects. Have worked for most of the US VCSEL suppliers, including HP/Agilent (now Avago), Finisar (formerly Honeywell / AOCD), Emcore, and JDSU (formerly Picolight). Primarly expertise in semiconductor laser reliability testing and failure analysis; secondary expertise in fiber optic transceiver reliability testing and in electrostatic discharge control.
Publications (19)

Proceedings Article | 15 March 2023 Presentation + Paper
Proceedings Volume 12440, 1244002 (2023) https://doi.org/10.1117/12.2652046
KEYWORDS: Quantum dot lasers, Semiconductor lasers, Reliability, Indium arsenide, Silicon photonics

Proceedings Article | 4 March 2022 Presentation + Paper
Proceedings Volume 12021, 1202108 (2022) https://doi.org/10.1117/12.2607340
KEYWORDS: Diffusion, Temperature metrology, Silicon, Indium arsenide, Semiconductor lasers, Beryllium, Gallium arsenide, Gallium, Reliability, Laser applications

Proceedings Article | 5 March 2021 Presentation + Paper
Proceedings Volume 11705, 117050K (2021) https://doi.org/10.1117/12.2579347
KEYWORDS: Silicon, Semiconductor lasers, Reliability, Indium arsenide, Quantum dot lasers, Active optics, Statistical analysis, Silicon photonics, Quantum dots, Gallium arsenide

Proceedings Article | 26 February 2020 Presentation + Paper
Proceedings Volume 11285, 1128504 (2020) https://doi.org/10.1117/12.2542912
KEYWORDS: Silicon, Semiconductor lasers, Quantum dots, Gallium arsenide, Silicon photonics, Laser applications, Reliability, Quantum wells, Quantum dot lasers, Crystals

Proceedings Article | 24 February 2020 Presentation + Paper
Proceedings Volume 11301, 113010L (2020) https://doi.org/10.1117/12.2545901
KEYWORDS: Silicon, Diffusion, Semiconductor lasers, Gallium arsenide, Gallium, Electroluminescence, Quantum efficiency, Quantum dots, Photonic integrated circuits, Semiconducting wafers

Showing 5 of 19 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 16 April 2002

SPIE Conference Volume | 16 April 2002

Conference Committee Involvement (2)
Testing and Reliability of Optoelectronic Devices
22 January 2002 | San Jose, California, United States
Test and Measurement Applications of Optoelectronic Devices
21 January 2002 | San Jose, California, United States
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