Dr. Robert W. Herrick
Sr. Reliability Engineer at
SPIE Involvement:
Author
Area of Expertise:
VCSEL Reliability , Semiconductor Laser Reliability , Optoelectronic Reliability , VCSEL Failure analysis , Semiconductor Laser Failure Analysis , Control of Electrostatic Discharge
Profile Summary

Have worked in most areas of semiconductor laser fabrication and test, including modeling, design, fabrication, process development, reliability testing, and failure analysis. Ph.D. in VCSEL reliability and failure analysis; have published many of the papers available on those subjects. Have worked for most of the US VCSEL suppliers, including HP/Agilent (now Avago), Finisar (formerly Honeywell / AOCD), Emcore, and JDSU (formerly Picolight). Primarly expertise in semiconductor laser reliability testing and failure analysis; secondary expertise in fiber optic transceiver reliability testing and in electrostatic discharge control.
Publications (16)

Proceedings Article | 26 February 2020 Presentation + Paper
Proc. SPIE. 11285, Silicon Photonics XV
KEYWORDS: Quantum wells, Crystals, Gallium arsenide, Silicon, Reliability, Laser applications, Quantum dots, Semiconductor lasers, Silicon photonics, Quantum dot lasers

Proceedings Article | 24 February 2020 Presentation + Paper
Proc. SPIE. 11301, Novel In-Plane Semiconductor Lasers XIX
KEYWORDS: Gallium arsenide, Silicon, Diffusion, Quantum efficiency, Electroluminescence, Quantum dots, Semiconductor lasers, Photonic integrated circuits, Semiconducting wafers, Gallium

Proceedings Article | 1 March 2019 Paper
Proc. SPIE. 10939, Novel In-Plane Semiconductor Lasers XVIII
KEYWORDS: Reliability, Quantum dots, Semiconductor lasers, Silicon photonics

Proceedings Article | 18 September 2018 Presentation + Paper
Proc. SPIE. 10771, Quantum Communications and Quantum Imaging XVI
KEYWORDS: Transparency, Gallium arsenide, Silicon, Doping, Quantum dots, Semiconductor lasers, Silicon photonics, Gallium, Quantum dot lasers, Absorption

Proceedings Article | 13 March 2013 Paper
Proc. SPIE. 8639, Vertical-Cavity Surface-Emitting Lasers XVII
KEYWORDS: Oxides, Sensors, Dielectrics, Reliability, Corrosion, Transmission electron microscopy, Humidity, Epoxies, Vertical cavity surface emitting lasers, Failure analysis

Showing 5 of 16 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 16 April 2002

SPIE Conference Volume | 16 April 2002

Conference Committee Involvement (2)
Testing and Reliability of Optoelectronic Devices
22 January 2002 | San Jose, California, United States
Test and Measurement Applications of Optoelectronic Devices
21 January 2002 | San Jose, California, United States
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