Robert Kowarsch
Research Associate at Technische Univ Clausthal
Area of Expertise:
Optical metrology , Label-free superresolution microscopy , Laser-Doppler vibrometry , Confocal scanning microscopy
Publications (6)

Proceedings Article | 17 September 2018 Presentation
Proc. SPIE. 10726, Nanoimaging and Nanospectroscopy VI
KEYWORDS: Confocal microscopy, Diffraction, Optical lithography, Super resolution, Modulation, Opacity, Microscopy, Molecules, Dielectrics, Absorbance

Proceedings Article | 18 August 2018 Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Laser sources, Microscopes, Photodetectors, Optical filters, Electronics, Semiconductor lasers, Heterodyning, Vibrometry, Laser Doppler velocimetry, Acousto-optics

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Mechanics, Interferometers, Interferometry, Phase interferometry, Optical testing, Semiconductor lasers, Solids, 3D metrology, Wavelength tuning, Digital image correlation, 3D image processing, Phase shifts

SPIE Journal Paper | 26 March 2014
OE Vol. 53 Issue 03
KEYWORDS: Microscopes, Light scattering, Vibrometry, Interferometers, Motion measurement, Doppler effect, Microelectromechanical systems, Laser scattering, 3D metrology, Optical testing

Proceedings Article | 13 May 2013 Paper
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Microelectromechanical systems, Doppler effect, Scattering, Sensors, Optical testing, Heterodyning, Vibrometry, 3D metrology, Motion measurement, Signal detection

Showing 5 of 6 publications
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