Robert K. Lowry
Consultant at Electronic Materials Characterization
SPIE Involvement:
Author
Area of Expertise:
electronic components , materials analysis , component reliability , component authenticity , hermeticity , failure analysis
Websites:
Profile Summary

Consulting in selection and analysis of materials and processing for semiconductor devices and all types of electronic components with utmost concern for product quality, reliability, and authenticity.
Publications (2)

Proceedings Article | 15 February 2012 Paper
Richard Kullberg, Arthur Jonath, Robert Lowry
Proceedings Volume 8250, 82500H (2012) https://doi.org/10.1117/12.921305
KEYWORDS: Physics, Microelectromechanical systems, Diffusion, Packaging, Helium, Capillaries, Krypton, Sensors, Databases, Microelectronics

Proceedings Article | 9 February 2009 Paper
Proceedings Volume 7206, 720606 (2009) https://doi.org/10.1117/12.807970
KEYWORDS: Argon, Oxygen, Helium, Nitrogen, Hydrogen, Carbon dioxide, Failure analysis, Humidity, Databases, Process control

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