Robert K. Lowry
Consultant at Electronic Materials Characterization
SPIE Involvement:
Author
Area of Expertise:
electronic components , materials analysis , component reliability , component authenticity , hermeticity , failure analysis
Websites:
Profile Summary

Consulting in selection and analysis of materials and processing for semiconductor devices and all types of electronic components with utmost concern for product quality, reliability, and authenticity.
Publications (2)

PROCEEDINGS ARTICLE | February 15, 2012
Proc. SPIE. 8250, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
KEYWORDS: Microelectromechanical systems, Packaging, Sensors, Databases, Capillaries, Diffusion, Physics, Microelectronics, Helium, Krypton

PROCEEDINGS ARTICLE | February 9, 2009
Proc. SPIE. 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
KEYWORDS: Carbon dioxide, Databases, Argon, Hydrogen, Nitrogen, Oxygen, Humidity, Process control, Helium, Failure analysis

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