Dr. Robert E. Mallard
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

Proceedings Article | 22 January 2005
Proc. SPIE. 5716, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
KEYWORDS: Signal attenuation, Resistance, Microelectromechanical systems, Actuators, Reliability, Monte Carlo methods, Instrument modeling, Optical components, Receivers, Attenuators

Proceedings Article | 20 December 2004
Proc. SPIE. 5577, Photonics North 2004: Optical Components and Devices
KEYWORDS: Avalanche photodiodes, Photodiodes, Avalanche photodetectors, Reliability, Halogens, Lamps, Absorption, Ionization, Electrons, Semiconductor lasers

Proceedings Article | 25 March 2004
Proc. SPIE. 5277, Photonics: Design, Technology, and Packaging
KEYWORDS: Semiconductor lasers, Modulation, Reliability, Interfaces, Refractive index, Heterojunctions, Modes of laser operation, Quantum wells, Laser cutting, Laser damage threshold

Proceedings Article | 8 August 2003
Proc. SPIE. 5123, Advanced Optical Devices, Technologies, and Medical Applications
KEYWORDS: Semiconductor lasers, Laser damage threshold, Reliability, Interfaces, Quantum wells, Signal to noise ratio, Chlorine, Semiconducting wafers, Interference (communication), Diodes

Proceedings Article | 16 January 2003
Proc. SPIE. 4980, Reliability, Testing, and Characterization of MEMS/MOEMS II
KEYWORDS: Microelectromechanical systems, Actuators, Reliability, Failure analysis, Resistance, Oxides, Signal attenuation, Attenuators, Optical components, Instrument modeling

Showing 5 of 6 publications
Conference Committee Involvement (1)
Silicon Photonics: from Fundamental Research to Manufacturing
29 March 2020 | Strasbourg, France
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