Robert B. Mason
Sr. Materials Engineer at Concurrent Technologies Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 6, 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Packaging, Silicon, Manufacturing, Reliability, Corrosion, Microelectronics, Defense technologies, Failure analysis, Standards development

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