Dr. Robert A. Nadon
Product Marketing Mgr. & Sales at Intelligent Photonics Control Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 June 2001 Paper
Robert Nadon, Peide Shi, Adonis Skandalis, Erik Woody, Hermann Hubschle, Edward Susko, Nezar Rghei, Peter Ramm
Proceedings Volume 4266, (2001) https://doi.org/10.1117/12.427999
KEYWORDS: Error analysis, Statistical analysis, Statistical inference, Data mining, Data modeling, Data analysis, Image processing, Image quality, Image analysis, Profiling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top