Robert P. O'Reilly
Senior Dynamicist at Analog Devices Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 January 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Safety, Data modeling, Sensors, Metals, Reliability, Amplifiers, Gyroscopes, Missiles, Analog electronics

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