Dr. Robert Osiander
Research Associate at Johns Hopkins Univ Applied Physics Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (33)

PROCEEDINGS ARTICLE | May 13, 2011
Proc. SPIE. 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III
KEYWORDS: Electron beams, Electrons, Silicon, Magnetism, Imaging spectroscopy, Terahertz radiation, Explosives, Optical alignment, Microfabrication, Carbon nanotubes

PROCEEDINGS ARTICLE | May 8, 2010
Proc. SPIE. 7691, Space Missions and Technologies
KEYWORDS: Electronics, Sensors, Electrodes, Spectroscopy, Microchannel plates, Ions, Collimators, Head, Space operations, Plasma

PROCEEDINGS ARTICLE | April 27, 2010
Proc. SPIE. 7670, Passive Millimeter-Wave Imaging Technology XIII
KEYWORDS: Fabrication, Optical design, Electron beams, Imaging systems, Electrodes, Silicon, Magnetism, Image resolution, Microfabrication, Carbon nanotubes

PROCEEDINGS ARTICLE | May 1, 2009
Proc. SPIE. 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense
KEYWORDS: Thermography, Infrared sensors, Sensors, Silicon, Resistance, Black bodies, Terahertz radiation, Bridges, Infrared radiation, Signal detection

PROCEEDINGS ARTICLE | February 14, 2008
Proc. SPIE. 6893, Terahertz Technology and Applications
KEYWORDS: Reflection, Spectroscopy, Crystals, Reflectivity, Solids, Terahertz radiation, Explosives, Reflectance spectroscopy, Terahertz spectroscopy, Absorption

PROCEEDINGS ARTICLE | May 4, 2007
Proc. SPIE. 6549, Terahertz for Military and Security Applications V
KEYWORDS: Electron beams, Electrodes, Metals, Particles, Electrons, Silicon, Imaging spectroscopy, Terahertz radiation, Explosives, Semiconducting wafers

Showing 5 of 33 publications
Conference Committee Involvement (4)
Micro- and Nanotechnology Sensors, Systems, and Applications XI
14 April 2019 | Baltimore, Maryland, United States
Micro- and Nanotechnology Sensors, Systems, and Applications IX
9 April 2017 | Anaheim, California, United States
Micro- and Nanotechnology Sensors, Systems, and Applications IV
23 April 2012 | Baltimore, Maryland, United States
Micro- and Nanotechnology Sensors, Systems, and Applications III
25 April 2011 | Orlando, Florida, United States
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