Mr. Robert Brian Reid
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 3, 2006
Proc. SPIE. 6240, Polarization: Measurement, Analysis, and Remote Sensing VII
KEYWORDS: Long wavelength infrared, Polarization, Error analysis, Surface roughness, Polarimetry, Refraction, Infrared radiation, Algorithm development, Model-based design, Dielectric polarization

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