Robert Brian Reid
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2006
Proc. SPIE. 6240, Polarization: Measurement, Analysis, and Remote Sensing VII
KEYWORDS: Long wavelength infrared, Polarization, Error analysis, Surface roughness, Polarimetry, Refraction, Infrared radiation, Algorithm development, Model-based design, Dielectric polarization

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top