Prof. Robert O. Ritchie
at Univ of California Berkeley
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 February 2009
Proc. SPIE. 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
KEYWORDS: Microelectromechanical systems, Calibration, Particles, Silicon, Scanning electron microscopy, Transmission electron microscopy, Humidity, Abrasives, Adhesives, Surface finishing

SPIE Journal Paper | 1 May 2005
JBO Vol. 10 Issue 03
KEYWORDS: Bone, Raman spectroscopy, Deep ultraviolet, Luminescence, Ultraviolet radiation, Spectroscopy, Visible radiation, Collagen, Raman scattering, Resonance enhancement

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