Robin Gruna
at Karlsruhe Insitute of Technology (KIT)
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 2, 2012
Proc. SPIE. 8300, Image Processing: Machine Vision Applications V
KEYWORDS: Reflectors, Principal component analysis, Cameras, Image processing, Inspection, Reflectivity, Feature extraction, Projection systems, Machine vision, Image classification

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