Rod L. Schuster
Key Account Manager at Newport Corp a division of MKS Instruments
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 November 2010
Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010
KEYWORDS: Oxides, Polishing, Silica, Laser induced damage, Laser damage threshold, Q switched lasers, Cerium, Pulsed laser operation, Surface finishing, Plasma

Proceedings Article | 30 December 2008
Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008
KEYWORDS: Antireflective coatings, Polishing, Silica, Reflection, Coating, Laser damage threshold, Q switched lasers, Cerium, Pulsed laser operation, Surface finishing

Proceedings Article | 22 February 2008
Proc. SPIE. 6873, Fiber Lasers V: Technology, Systems, and Applications
KEYWORDS: Polishing, Silica, Ionization, Laser damage threshold, Picosecond phenomena, Q switched lasers, Optical damage, Pulsed laser operation, Surface finishing, Plasma

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