Prof. Roger Appleby
Consultant MMW and THz technology at
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Chair | Symposium Committee | Track Chair | Author
Area of Expertise:
PMMW Imaging , Terahertz , Electro-optic imaging
Publications (53)

PROCEEDINGS ARTICLE | November 30, 2017
Proc. SPIE. 2250, International Conference on Millimeter and Submillimeter Waves and Applications 1994
KEYWORDS: Defense and security, Thermography, Fiber optic gyroscopes, Imaging systems, Image processing, Receivers, Image quality, Radiometry, Spatial resolution, Passive millimeter wave imaging

PROCEEDINGS ARTICLE | May 11, 2017
Proc. SPIE. 10189, Passive and Active Millimeter-Wave Imaging XX
KEYWORDS: Security technologies, Millimeter wave imaging, Imaging systems, Remote sensing, Nondestructive evaluation, Signal processing, Passive remote sensing, Synthetic vision

PROCEEDINGS ARTICLE | October 21, 2016
Proc. SPIE. 9993, Millimetre Wave and Terahertz Sensors and Technology IX
KEYWORDS: Modeling, Data modeling, Imaging systems, Scattering, Sensors, Skin, 3D modeling, Bidirectional reflectance transmission function, Volume rendering, Temperature metrology

PROCEEDINGS ARTICLE | May 19, 2015
Proc. SPIE. 9462, Passive and Active Millimeter-Wave Imaging XVIII
KEYWORDS: Radar, Refractive index, Data modeling, Visualization, Imaging systems, Skin, 3D modeling, Performance modeling, Systems modeling, Temperature metrology

PROCEEDINGS ARTICLE | June 4, 2013
Proc. SPIE. 8725, Micro- and Nanotechnology Sensors, Systems, and Applications V
KEYWORDS: Semiconductors, Nanotechnology, Imaging systems, Gallium arsenide, Receivers, Diodes, Radiometry, Neodymium, Microwave radiation, Passive millimeter wave imaging

PROCEEDINGS ARTICLE | October 26, 2012
Proc. SPIE. 8544, Millimetre Wave and Terahertz Sensors and Technology V
KEYWORDS: Modeling, Refractive index, Millimeter wave imaging, Visualization, Imaging systems, Sensors, Image processing, Computer simulations, Bidirectional reflectance transmission function, Ray tracing

Showing 5 of 53 publications
Conference Committee Involvement (30)
Passive and Active Millimeter-Wave Imaging XXII
18 April 2019 | Baltimore, Maryland, United States
Micro- and Nanotechnology Sensors, Systems, and Applications XI
14 April 2019 | Baltimore, Maryland, United States
Passive and Active Millimeter-Wave Imaging XXI
19 April 2018 | Orlando, Florida, United States
Micro- and Nanotechnology Sensors, Systems, and Applications X
15 April 2018 | Orlando, Florida, United States
Passive and Active Millimeter-Wave Imaging XX
13 April 2017 | Anaheim, California, United States
Showing 5 of 30 published special sections
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