Dr. Roger Artigas
at Sensofar Tech SL
SPIE Involvement:
Publications (17)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Confocal microscopy, Microscopes, Microscopy, Interferometry, 3D metrology, 3D scanning

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Confocal microscopy, Microscopes, Stars, Cameras, Calibration, Optical testing, 3D metrology, Objectives, Standards development, 3D image processing

Proceedings Article | 7 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Metrology, 3D imaging standards, Calibration, Time metrology, Solids, 3D metrology, Neodymium, Standards development, 3D image processing

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Confocal microscopy, Microscopes, Monochromatic aberrations, Cameras, Calibration, Error analysis, 3D image processing

Proceedings Article | 23 February 2018 Paper
Proc. SPIE. 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
KEYWORDS: Microscopes, Diffraction, Optical transfer functions, Stars, Interferometers, Calibration, Manufacturing, 3D metrology, Objectives, Standards development

Showing 5 of 17 publications
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