Dr. Rolanas Dauksevicius
at Kaunas Univ of Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Microelectromechanical systems, Semiconductors, Holograms, Holography, Switches, Switching, 3D image reconstruction, Sensors, Optical testing, Virtual reality

PROCEEDINGS ARTICLE | May 16, 2005
Proc. SPIE. 5763, Smart Structures and Materials 2005: Smart Electronics, MEMS, BioMEMS, and Nanotechnology
KEYWORDS: Mathematical modeling, Microelectromechanical systems, Semiconductors, Switches, Switching, Electrodes, Nickel, 3D modeling, Device simulation, Surface micromachining

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