Dr. Roland Thielsch
at Southwall Europe GmbH
SPIE Involvement:
Author
Publications (30)

Proceedings Article | 5 October 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Thin films, Diffraction, Refractive index, Deep ultraviolet, Silica, Optical properties, Crystals, Reflectivity, Excimer lasers, Vacuum ultraviolet

Proceedings Article | 5 October 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Thin films, Refractive index, Silicon, Calcium, Atomic force microscopy, Silicon films, Lanthanum, Vacuum ultraviolet, Gadolinium, Lanthanides

Proceedings Article | 25 February 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Diffraction, Multilayers, Silica, Ultraviolet radiation, Crystals, Silicon, Coating, Silicon films, Temperature metrology

Proceedings Article | 25 February 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Diffraction, Refractive index, Data modeling, Water, Crystals, X-ray diffraction, Interfaces, Ions, Ion beams

Proceedings Article | 30 May 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Thin films, Mirrors, Multilayers, Silica, Ultraviolet radiation, Luminescence, Coating, Laser induced fluorescence, Aluminum, Color centers

Proceedings Article | 25 February 2002
Proc. SPIE. 4426, Second International Symposium on Laser Precision Microfabrication
KEYWORDS: Optical lithography, Silica, Dielectrics, Reflectivity, Oxygen, Scanning electron microscopy, Laser ablation, Photomasks, Laser damage threshold, Absorption

Showing 5 of 30 publications
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