Rolando A. Quinones
at Univ Gent
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 14, 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Metrology, Scanners, Manufacturing, Feature extraction, Image analysis, Optical inspection, Reconstruction algorithms, Analytical research, Autoregressive models, Standards development

PROCEEDINGS ARTICLE | September 10, 2011
Proc. SPIE. 8136, Mathematics of Data/Image Pattern Coding, Compression, and Encryption with Applications XIII
KEYWORDS: Statistical analysis, Image compression, Detection and tracking algorithms, Visualization, Image processing, Feature extraction, Image analysis, Spatial resolution, Autoregressive models, Binary data

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