Dr. Rolf Follath
at Paul Scherrer Institute
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Optical components, Mirrors, Metrology, Sensors, Reflectivity, Reflectometry, Collimation, Extreme ultraviolet, Monochromators, Diffraction gratings

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8789, Modeling Aspects in Optical Metrology IV
KEYWORDS: Optical components, Mirrors, Optical design, X-rays, Interferometry, Synchrotrons, Monochromators, Grazing incidence, Free electron lasers, Optics manufacturing

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Mirrors, Light sources, Calibration, Spectroscopy, X-rays, Computer programming, Head, Autocollimators, Analog electronics, Monochromators

PROCEEDINGS ARTICLE | May 18, 2007
Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics
KEYWORDS: Mirrors, Optical design, Electron beams, Modulation, X-rays, Magnetism, Modulators, Picosecond phenomena, Pulsed laser operation, Free electron lasers

PROCEEDINGS ARTICLE | November 3, 1997
Proc. SPIE. 3150, Gratings and Grating Monochromators for Synchrotron Radiation
KEYWORDS: Energy efficiency, Diffraction, Optical design, Data modeling, Phase modulation, Sensors, Transmittance, Synchrotron radiation, Monochromators, Diffraction gratings

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