Dr. Roman Antos Profile

Dr. Roman Antos

Researcher at Charles Univ

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Publications (7)

PROCEEDINGS ARTICLE | May 18, 2011

Complex Fourier factorization techniques in calculation of modes of discontinuous optical structures with an arbitrary cross-section

Proc. SPIE. 8070, Metamaterials VI

KEYWORDS: Optical components, Polarization, Matrices, Photonic crystals, Holmium, Europium, Statistical modeling, Performance modeling, Diffraction gratings, Maxwell's equations

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PROCEEDINGS ARTICLE | May 12, 2009

Complex Fourier factorization method applied in modeling optical metamaterials based on 2D periodic nanostructures

Proc. SPIE. 7353, Metamaterials IV

KEYWORDS: Gold, Nanostructures, Diffraction, Polarization, Quartz, Matrices, Silicon, Reflectivity, Optical metamaterials, Diffraction gratings

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PROCEEDINGS ARTICLE | April 12, 2007

Characteristic matrix of anisotropic coupling gap

Proc. SPIE. 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Refractive index, Prisms, Waveguides, Polarization, Matrices, Interfaces, Reflectivity, Magnetism, Liquids, Anisotropy

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PROCEEDINGS ARTICLE | February 2, 2007

Observation of coupled magnetic vortex structure dynamics by time-resolved magneto-optical Kerr effect microscopy

Proc. SPIE. 6479, Quantum Sensing and Nanophotonic Devices IV

KEYWORDS: Microscopes, Microscopy, Crystals, Magnetism, Fourier transforms, Kerr effect, Semiconductor lasers, CCD cameras, Objectives, Analytical research

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PROCEEDINGS ARTICLE | October 20, 2005

Optical metrology of binary arrays of holes in semiconductor media using microspot spectroscopic ellipsometry

Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II

KEYWORDS: Diffraction, Optical lithography, Silicon, Scanning electron microscopy, Scatterometry, Optical metrology, Spectroscopic ellipsometry, Semiconducting wafers, Binary data, Diffraction gratings

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PROCEEDINGS ARTICLE | August 27, 2005

Airy-like internal reflection series applied in scatterometry and simulations of gratings

Proc. SPIE. 5858, Nano- and Micro-Metrology

KEYWORDS: Semiconductors, Diffraction, Polarization, Silicon, Magnetism, Scatterometry, Solids, Tantalum, Diffraction gratings, Algorithms

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PROCEEDINGS ARTICLE | May 10, 2005

Optical metrology of patterned magnetic structures: deep versus shallow gratings

Proc. SPIE. 5752, Metrology, Inspection, and Process Control for Microlithography XIX

KEYWORDS: Oxides, Diffraction, Spectroscopy, Nickel, Silicon, Magnetism, Chromium, Atomic force microscopy, Molybdenum, Diffraction gratings

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Showing 5 of 7 publications

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