Mr. Roman Velgan
at Univ Erlangen-Nürnberg
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Metals, Defect detection, Clouds, Projection systems, Inspection, Optical testing, Visualization, Manufacturing, Digital micromirror devices, CCD cameras

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