Ron Kimmel
at Technion-Israel Institute of Technology
SPIE Involvement:
Publications (5)

Proceedings Article | 30 May 2002 Paper
Irwin Sobel, Ron Kimmel, Michael Elad, Renato Keshet, Doron Shaked
Proceedings Volume 4662, (2002)
KEYWORDS: Reflectivity, Reconstruction algorithms, RGB color model, Image processing, Convolution, Image resolution, Visual system, Linear filtering, Computer programming, Image analysis

Proceedings Article | 11 August 1995 Paper
Vicent Caselles, Guillermo Sapiro, Ron Kimmel
Proceedings Volume 2573, (1995)
KEYWORDS: 3D modeling, Medical imaging, 3D metrology, Algorithm development, Tumors, Lawrencium, 3D image processing, Motion models, Chemical elements, Detection and tracking algorithms

Proceedings Article | 4 January 1995 Paper
Ron Kimmel, Nahum Kiryati
Proceedings Volume 2356, (1995)
KEYWORDS: Vision geometry, Error analysis, Algorithm development, Electrical engineering, Robotics, Shape analysis, Brain, Numerical analysis, Differential equations, Numerical integration

Proceedings Article | 4 January 1995 Paper
Doron Shaked, Alfred Bruckstein, Ron Kimmel, Nahum Kiryati
Proceedings Volume 2356, (1995)
KEYWORDS: Image segmentation, Vision geometry, Shape analysis, Wave propagation, Wavefronts, Binary data, Electrical engineering, Visual process modeling, Distance measurement, Computer science

Proceedings Article | 23 June 1993 Paper
Ron Kimmel, Alfred Bruckstein
Proceedings Volume 2031, (1993)
KEYWORDS: Transform theory, Wave propagation, Machine vision, Computer vision technology, Electrical engineering, Image segmentation, Wavefronts, Image resolution, Computer science, Binary data

Conference Committee Involvement (1)
Parallel Processing for Imaging Applications
24 January 2011 | San Francisco Airport, California, United States
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