Ron Schneider
Engineer at Elbit Systems Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 June 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Microelectromechanical systems, Signal to noise ratio, Mirrors, Backscatter, Imaging systems, Cameras, Sensors, Gated imaging, Pulsed laser operation, Camera shutters

Proceedings Article | 1 October 2009
Proc. SPIE. 7482, Electro-Optical Remote Sensing, Photonic Technologies, and Applications III
KEYWORDS: Signal to noise ratio, Light sources, Backscatter, Imaging systems, Cameras, Remote sensing, Night vision, Night vision systems, Nominal ocular hazard distance, Fiber optic illuminators

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