Dr. Ronald G. Driggers
CEO at St Johns Optical Systems
SPIE Involvement:
Board of Directors | Publications Committee | Fellow status | Conference Program Committee | Conference Chair | Symposium Committee | Author | Instructor
Publications (166)

PROCEEDINGS ARTICLE | June 22, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Staring arrays, Signal to noise ratio, Mid-IR, Electronics, Sensors, Photoresistors, Crystals, Interference (communication), Electric field sensors, Lead

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX

PROCEEDINGS ARTICLE | May 8, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Readout integrated circuits, Long wavelength infrared, Signal to noise ratio, Infrared imaging, Mid-IR, Imaging systems, Sensors, Image processing, Infrared radiation, Modulation transfer functions

SPIE Journal Paper | May 4, 2018
OE Vol. 57 Issue 05
KEYWORDS: Sensors, Infrared search and track, Signal to noise ratio, Long wavelength infrared, Mid-IR, Staring arrays, Target detection, Infrared sensors, Photons, Signal detection

PROCEEDINGS ARTICLE | April 26, 2018
Proc. SPIE. 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
KEYWORDS: Target detection, Infrared search and track, Staring arrays, Long wavelength infrared, Signal to noise ratio, Unmanned aerial vehicles, Point spread functions, Sensors, Black bodies, Infrared radiation

PROCEEDINGS ARTICLE | April 26, 2018
Proc. SPIE. 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
KEYWORDS: Target detection, Staring arrays, Imaging systems, Electro optical systems

Showing 5 of 166 publications
Conference Committee Involvement (34)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
14 April 2019 | Baltimore, Maryland, United States
Infrared Technology and Applications XLV
14 April 2019 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Technology and Applications XLIV
16 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Showing 5 of 34 published special sections
Course Instructor
SC181: Predicting Target Acquisition Performance of Electro-Optical Imagers
This course describes how to predict and evaluate electro-optical (EO) imager performance. Metrics that quantify imager resolution are described. The detection, recognition, and identification tasks are discussed, and the meaning of acquisition probabilities is explained. The basic theory of operation of thermal imagers, image intensifiers, and video cameras is presented. This course describes how to quantify the resolution and noise characteristics of an EO imager. The theory and analysis of sampled imagers is emphasized. Image quality metrics are described, and the relationship between image quality and target acquisition performance is explained. The course provides a complete overview of how to analyze and evaluate the performance of EO imagers.
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