Mr. Rudolf L. van Renesse
Research Scientist at VanRenesse Consulting
SPIE Involvement:
Conference Chair | Author | Instructor
Publications (19)

PROCEEDINGS ARTICLE | February 9, 2006
Proc. SPIE. 6075, Optical Security and Counterfeit Deterrence Techniques VI
KEYWORDS: Internet, Visualization, Video, Photography, Inspection, Image resolution, Printing, Cadmium sulfide, Information security, Network security

SPIE Conference Volume | February 8, 2006

SPIE Conference Volume | June 3, 2004

PROCEEDINGS ARTICLE | April 19, 2002
Proc. SPIE. 4677, Optical Security and Counterfeit Deterrence Techniques IV
KEYWORDS: Eye, Moire patterns, Phase modulation, Modulation, Visualization, Data hiding, Inspection, Phase shift keying, Printing, Information security

PROCEEDINGS ARTICLE | April 19, 2002
Proc. SPIE. 4677, Optical Security and Counterfeit Deterrence Techniques IV
KEYWORDS: Holography, Diffusion, Photography, Surface roughness, Applied physics, Adhesives, Testing and analysis, Security printing, Lead

SPIE Conference Volume | April 19, 2002

Showing 5 of 19 publications
Conference Committee Involvement (6)
Optical Security and Counterfeit Deterrence Techniques VI
18 January 2006 | San Jose, California, United States
Optical Security and Counterfeit Deterrence Techniques V
20 January 2004 | San Jose, California, United States
Optical Security and Counterfeit Deterrence Techniques IV
24 January 2002 | San Jose, California, United States
Optical Security and Counterfeit Deterrence Techniques III
27 January 2000 | San Jose, CA, United States
Optical Security and Counterfeit Deterrence Techniques II
29 January 1998 | San Jose, CA, United States
Showing 5 of 6 published special sections
Course Instructor
SC087: Optical Document Security
This course gives an overview of a wide variety of optical security features ranging from classic optically invariable devices, such as watermarks and intaglio printing, via tilt images, fluorescence and digital anti-copy devices to optically variable devices, based on diffraction and interference. Their basic physical principles are treated and their first and second line inspection properties are discussed. Genuine and counterfeit documents will be used as illustrations.
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