Rui Li
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 October 2016
Proc. SPIE. 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
KEYWORDS: Thin films, Femtosecond phenomena, Silicon, Semiconductor lasers, Scanning electron microscopy, Silicon films, Infrared radiation, Selenium, Tellurium, Absorption

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