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Rui Xu
Graduate Student at Univ of Electronic Science and Technology of China
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Publications (2)
Proceedings Article | 17 December 2011 Paper
Structural and photoelectronic properties of a-SiGe:H thin films with varied Ge prepared by PECVD
Rui Xu, Wei Li, Jian He, Kang-Cheng Qi, Ya-Dong Jiang
Proceedings Volume 8312, 83120Q (2011) https://doi.org/10.1117/12.904214
KEYWORDS: Thin films, Absorption, Raman spectroscopy, Germanium, FT-IR spectroscopy, Silicon, Plasma enhanced chemical vapor deposition, UV-Vis spectroscopy, Spectroscopy, Electrodes
Proceedings Article | 17 December 2011 Paper
Structural evolution and electronic properties of [i]n[/i]-type doped hydrogenated amorphous silicon thin films
Jian He, Wei Li, Rui Xu, Kang-Cheng Qi, Ya-Dong Jiang
Proceedings Volume 8312, 831206 (2011) https://doi.org/10.1117/12.903747
KEYWORDS: Thin films, Raman spectroscopy, Hydrogen, Absorption, Amorphous silicon, FT-IR spectroscopy, Plasma enhanced chemical vapor deposition, Chemical species, Thin film devices, Thin film deposition
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