Prof. Ruogu Zhu
at China Jiliang Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | October 11, 2010
Proc. SPIE. 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Fabry–Perot interferometers, Fabry–Perot interferometry, Modulation, Teeth, Interferometers, Ceramics, Reflectivity, Interferometry, Phase interferometry, Scanning probe microscopy

PROCEEDINGS ARTICLE | January 12, 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

PROCEEDINGS ARTICLE | January 30, 2008
Proc. SPIE. 6831, Nanophotonics, Nanostructure, and Nanometrology II
KEYWORDS: Mirrors, Metrology, Doppler effect, Optical properties, Reflection, Sensors, Particles, Photons, Free space, Free space optics

PROCEEDINGS ARTICLE | October 25, 2006
Proc. SPIE. 6280, Third International Symposium on Precision Mechanical Measurements
KEYWORDS: Visualization, Sensors, Metals, Manufacturing, Physics, 3D modeling, Capacitance, Mathematics, Laser manufacturing, 3D image processing

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Scattering, Sensors, Chemical species, Particles, Hydrogen, Atomic force microscopy, Bridges, Atomic force microscope, Spherical lenses, Animal model studies

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Mirrors, Metrology, 3D imaging standards, Sensors, Calibration, Atomic force microscopy, Laser stabilization, Scanning probe microscopy, Phase measurement, Standards development

Showing 5 of 7 publications
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