Dr. Russell A. Crook
EO-IR and Spacecraft Systems at Alliant Techsystems Inc
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | May 1, 2006
OE Vol. 45 Issue 05
KEYWORDS: Particles, Contamination, Spherical lenses, Autoregressive models, Inspection, Data modeling, Optical engineering, Reflectivity, Stray light, Failure analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top