Prof. Russell M. Gwilliam
Director of Technology at Univ of Surrey
SPIE Involvement:
Author
Publications (15)

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8982, Optical Components and Materials XI
KEYWORDS: Chalcogenide glass, Ferroelectric materials, Electrons, Interfaces, Silicon, Chalcogenides, Doping, Ion implantation, Bismuth, Heterojunctions

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8982, Optical Components and Materials XI
KEYWORDS: Oxides, Near infrared, Chalcogenide glass, Silica, Glasses, Crystals, Chalcogenides, Doping, Bismuth, Absorption

PROCEEDINGS ARTICLE | February 27, 2014
Proc. SPIE. 9002, Novel In-Plane Semiconductor Lasers XIII
KEYWORDS: Oscillators, Mode locking, Quantum dots, Optical testing, Phonons, Picosecond phenomena, Pulsed laser operation, Quantum dot lasers, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | January 17, 2011
Proc. SPIE. 7943, Silicon Photonics VI
KEYWORDS: Wafer-level optics, Waveguides, Fiber Bragg gratings, Ions, Silicon, Optical testing, Ion implantation, Silicon photonics, Semiconducting wafers, Wafer testing

PROCEEDINGS ARTICLE | February 17, 2010
Proc. SPIE. 7606, Silicon Photonics V
KEYWORDS: Silica, Spectroscopy, Annealing, Luminescence, Ions, Silicon, Sapphire, Erbium, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | February 17, 2010
Proc. SPIE. 7606, Silicon Photonics V
KEYWORDS: Oxides, Silica, Annealing, Silicon, Diffusion, Transmission electron microscopy, Raman spectroscopy, Phonons, Nanocrystals, Temperature metrology

Showing 5 of 15 publications
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