Dr. Russell M. Kurtz
Director of R&D at Luminit LLC
SPIE Involvement:
Area of Expertise:
lasers , nonlinear optics , NDE , metrology , photorefractivity
Profile Summary

Russell Kurtz, Ph.D., received his SB in Electrical Engineering from MIT, and his PhD in Quantum Electronics and Optics from USC. Currently Chief Scientist at RAN Science & Technology, LLC, Dr. Kurtz has previously worked at such diverse companies as Physical Optics Corp., Hughes Aircraft, and The Aerospace Corp. During his 30 years as a professional scientist and engineer, he has successfully led 25 research, development, and engineering projects in FLIRs/NVS (NIR, MWIR, and LWIR), new laser materials and applications, nondestructive evaluation, high-resolution metrology, 3D and high-resolution displays, high-energy lasers, laser beam combination, hydrogen generation and purification, applications of holographic optical elements (HOEs), long-range detection and spectroscopy, photovoltaics, and vibrometry. Current research areas include laser optimization through material selection, combining acoustic and shearographic NDE, improving metrology through optical and software methods, and applications of photorefractivity to remote sensing. Dr. Kurtz has participated in 20 inventions and is the primary inventor on three patents pending. In addition to his Life Membership in SPIE, Dr. Kurtz is a Life Member of the Association of Old Crows, a Senior Member of IEEE, and a Member of OSA, DEPS, and AAAS. He has contributed to 23 conference proceedings and eight papers in peer-reviewed journals.
Publications (15)

PROCEEDINGS ARTICLE | February 20, 2018
Proc. SPIE. 10513, Components and Packaging for Laser Systems IV
KEYWORDS: Mirrors, Diffractive optical elements, Semiconductor lasers, Computer generated holography, Laser resonators, Laser crystals, Diode pumped solid state lasers

SPIE Journal Paper | July 1, 2011
OE Vol. 50 Issue 07
KEYWORDS: Metrology, Error analysis, Clouds, Interferometry, Optical spheres, Environmental sensing, Statistical analysis, Manufacturing, Time metrology, Statistical methods

PROCEEDINGS ARTICLE | February 7, 2011
Proc. SPIE. 7957, Practical Holography XXV: Materials and Applications
KEYWORDS: Refractive index, Mirrors, Beam splitters, Ferroelectric materials, Phase modulation, Modulation, Crystals, Phase shift keying, Laser crystals, Signal detection

Proc. SPIE. 7675, Photonics in the Transportation Industry: Auto to Aerospace III
KEYWORDS: Metrology, Defect detection, Composites, Nondestructive evaluation, Transducers, Collimation, Aluminum, Shearography, Acoustics, Surface finishing

Proc. SPIE. 6556, Micro (MEMS) and Nanotechnologies for Defense and Security
KEYWORDS: Photodetectors, Modulation, Sensors, Silicon, Raman spectroscopy, Capacitance, Telecommunications, Analog electronics, Data communications, Semiconducting wafers

PROCEEDINGS ARTICLE | February 6, 2007
Proc. SPIE. 6481, Quantum Dots, Particles, and Nanoclusters IV
KEYWORDS: Nanostructures, Spectroscopy, Crystals, Quantum dots, Raman spectroscopy, Micro raman spectroscopy, Phonons, Zinc oxide, Nanocrystals, Nanowires

Showing 5 of 15 publications
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