Mr. Ryan N. Goodner Profile

Ryan N. Goodner

at Sandia National Labs

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 14 May 2019 Paper

Optimization of hardware and image processing for improved image quality in x-ray phase contrast imaging

Amber Dagel, R. Derek West, Ryan Goodner, Steven Grover, Collin Epstein, Kyle Thompson

Proceedings Volume 10999, 109990S (2019) https://doi.org/10.1117/12.2521837

KEYWORDS: Image processing, Data acquisition, Image quality, X-ray imaging, Phase contrast

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Proceedings Article | 11 September 2018 Presentation + Paper

Unsupervised learning methods to perform material identification tasks on spectral computed tomography data

Isabel Gallegos, Srivathsan Koundinyan, April Suknot, Edward Jimenez, Kyle Thompson, Ryan Goodner

Proceedings Volume 10763, 107630G (2018) https://doi.org/10.1117/12.2326394

KEYWORDS: Ceramics, Computed tomography, Glasses, Mica, Machine learning, Zirconium dioxide, X-ray computed tomography, Image processing algorithms and systems, Binary data, Spectral computed tomography

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Proceedings Article | 14 May 2018 Presentation

Defect detection in foams and encapsulants using grating-based x-ray phase contrast imaging (Rising Researcher Presentation) (Conference Presentation)

Amber Dagel, Christian Arrington, Patrick Finnegan, Ryan Goodner, Andrew Hollowell

Proceedings Volume 10632, 106320M (2018) https://doi.org/10.1117/12.2305250

KEYWORDS: X-rays, X-ray imaging, Phase contrast, Foam, Defect detection, Inspection, Nondestructive evaluation, Synchrotrons, Tomography, Defect inspection

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Proceedings Article | 26 September 2017 Presentation + Paper

Leveraging multi-channel x-ray detector technology to improve quality metrics for industrial and security applications

Edward Jimenez, Kyle Thompson, Adriana Stohn, Ryan Goodner

Proceedings Volume 10393, 103930G (2017) https://doi.org/10.1117/12.2275850

KEYWORDS: Computer security, Radiography, Data acquisition, Sensors, Absorption, Nondestructive evaluation, X-rays, Computed tomography, Interfaces, Signal to noise ratio

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