Dr. Ryan M. Hickey
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 22 February 2018
Proc. SPIE. 10537, Silicon Photonics XIII
KEYWORDS: Silicon photonics, Quantum dot lasers, Resonators, Optical interconnects, Modulators, Modulation, Optical filters, Wavelength division multiplexing, Quantum dots, Waveguides

Proceedings Article | 6 October 2006
Proc. SPIE. 6352, Optoelectronic Materials and Devices
KEYWORDS: Signal attenuation, Receivers, Microelectromechanical systems, Optical alignment, Camera shutters, Attenuators, Roads, Integrated optics, Lens design, Tolerancing

Proceedings Article | 7 March 2005
Proc. SPIE. 5730, Optoelectronic Integration on Silicon II
KEYWORDS: Microelectromechanical systems, Receivers, Signal attenuation, Semiconducting wafers, Optical amplifiers, Silicon, Reliability, Variable optical attenuators, Optical fibers, Attenuators

Proceedings Article | 22 January 2005
Proc. SPIE. 5716, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
KEYWORDS: Signal attenuation, Resistance, Microelectromechanical systems, Actuators, Reliability, Monte Carlo methods, Instrument modeling, Optical components, Receivers, Attenuators

Proceedings Article | 16 January 2003
Proc. SPIE. 4980, Reliability, Testing, and Characterization of MEMS/MOEMS II
KEYWORDS: Microelectromechanical systems, Actuators, Reliability, Failure analysis, Resistance, Oxides, Signal attenuation, Attenuators, Optical components, Instrument modeling

Conference Committee Involvement (3)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
25 January 2006 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
25 January 2005 | San Jose, California, United States
Reliability, Testing, and Characterization of MEMS/MOEMS III
26 January 2004 | San Jose, California, United States
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