Ryan McDermott
at Univ of Strathclyde
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 March 2020
Proc. SPIE. 11280, Gallium Nitride Materials and Devices XV
KEYWORDS: Semiconductors, Hyperspectral imaging, Diffraction, Electron beams, Backscatter, Visualization, Crystals, Nondestructive evaluation, Scanning electron microscopy, Gallium nitride

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