Ryo Kizaki
at Osaka Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Refractive index, Mirrors, Beam splitters, Interferometers, Error analysis, Computer programming, Distance measurement, Spherical lenses

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