Ryotaro Nakamura
at Kyoto Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 11, 2012
Proc. SPIE. 8474, Optical Processes in Organic Materials and Nanostructures
KEYWORDS: Femtosecond phenomena, X-rays, Ions, X-ray microscopy, Silver, Atomic force microscopy, Scanning electron microscopy, Signal detection, Laser systems engineering, 3D microstructuring

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