Ryou Mutou
at Meisei Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 June 2020
Proc. SPIE. 11515, International Workshop on Advanced Imaging Technology (IWAIT) 2020
KEYWORDS: Convolutional neural networks, Databases, Image segmentation, Image analysis, Neural networks, Convolution, Optical character recognition, Tolerancing, Information science, Communication engineering

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