Ryouta Nakano
at Univ of Electro-Communications
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2005
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Independent component analysis, Target detection, Principal component analysis, Image filtering, Target recognition, Feature extraction, Sensors, Detector development, Automatic target recognition, Binary data

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