Ryouta Nakano
at Univ of Electro-Communications
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2005
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Target detection, Principal component analysis, Independent component analysis, Sensors, Feature extraction, Detector development, Image filtering, Target recognition, Automatic target recognition, Binary data

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top