Prof. Ryszard J. Pryputniewicz
Professor and Director at Worcester Polytechnic Institute
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Chair | Track Chair | Author
Publications (65)

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Microelectromechanical systems, Light emitting diodes, Sensors, Glasses, Interferometry, Nondestructive evaluation, Optical inspection, Optoelectronics, Gyroscopes, Tuning fork gyroscopes

SPIE Journal Paper | October 1, 2011
OE Vol. 50 Issue 10
KEYWORDS: Microelectromechanical systems, Sensors, Optoelectronics, Fringe analysis, Optical engineering, Electronics, Finite element methods, Calibration, Microsystems, Computing systems

PROCEEDINGS ARTICLE | September 14, 2010
Proc. SPIE. 7387, Speckle 2010: Optical Metrology
KEYWORDS: Microelectromechanical systems, Microscopes, Switches, Sensors, Interferometry, Computer simulations, Optoelectronics, Software development, Gyroscopes, Instrument modeling

PROCEEDINGS ARTICLE | August 25, 2009
Proc. SPIE. 7375, ICEM 2008: International Conference on Experimental Mechanics 2008
KEYWORDS: Microelectromechanical systems, Microscopes, Switches, Fiber optics, Computing systems, Interferometry, Computer simulations, CCD cameras, Optoelectronics, Computer aided design

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Microelectromechanical systems, Microscopes, Fringe analysis, Metrology, Switches, Reliability, CCD cameras, Optical metrology, Optoelectronics, Micromirrors

PROCEEDINGS ARTICLE | February 18, 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Microelectromechanical systems, Microscopes, Fringe analysis, Switches, Reliability, Nondestructive evaluation, CCD cameras, Optoelectronics, Finite element methods, Fused deposition modeling

Showing 5 of 65 publications
Conference Committee Involvement (23)
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection VIII
13 May 2013 | Munich, Germany
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Showing 5 of 23 published special sections
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