Ryusuke Nakajima
at Osaka Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 October 2005
Proc. SPIE. 6013, Optoelectronic Devices: Physics, Fabrication, and Application II
KEYWORDS: Refractive index, Prisms, Finite-difference time-domain method, Defect detection, Waveguides, Cladding, Silicon, Semiconducting wafers, Radio propagation, Defect inspection

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