CONFERENCE PROCEEDINGS
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Susumu Baba
at Advanced Engineering Services Co Ltd
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 9 September 2014 Paper
Evaluating the bakeout effectiveness of RTV-S691 silicone adhesive by measuring outgassing rate
Eiji Miyazaki, Yuka Miura, Osamu Numata, Riyo Yamanaka, Susumu Baba, Junichiro Ishizawa, Yugo Kimoto, Takashi Tamura
Proceedings Volume 9196, 91960A (2014) https://doi.org/10.1117/12.2061774
KEYWORDS: Adhesives, Silicon, Contamination, Optical coherence tomography, Aerospace engineering, Space operations, Control systems, Current controlled current source, Receivers, Liquids
Proceedings Article | 9 September 2014 Paper
Optical and re-emission behavior of silicone contaminants affected by UV irradiation with different wavelength ranges
Yuka Miura, Susumu Baba, Riyo Yamanaka, Osamu Numata, Eiji Miyazaki, Junichiro Ishizawa, Yugo Kimoto, Takashi Tamura
Proceedings Volume 9196, 91960H (2014) https://doi.org/10.1117/12.2061526
KEYWORDS: Ultraviolet radiation, Silicon, Semiconducting wafers, UV optics, Contamination, Vacuum ultraviolet, Telescopic pixel displays, Optical testing, Absorbance, Magnesium fluoride
Proceedings Article | 9 September 2014 Paper
Experimental measurement of the reflection behavior of contaminant molecules
Susumu Baba, Eiji Miyazaki, Yuka Miura, Riyo Yamanaka, Osamu Numata, Junichiro Ishizawa, Yugo Kimoto, Takashi Tamura
Proceedings Volume 9196, 919605 (2014) https://doi.org/10.1117/12.2061515
KEYWORDS: Mirrors, Molecules, Reflection, Data modeling, Cryogenics, Mathematical modeling, Contamination analysis, Space operations, Contamination, Systems modeling
Proceedings Article | 28 August 2014 Paper
Contamination control for the space infrared observatory SPICA
Naoki Isobe, Takao Nakagawa, Shun Okazaki, Yoichi Sato, Makiko Ando, Susumu Baba, Yuka Miura, Eiji Miyazaki, Yugo Kimoto, Junichiro Ishizawa, Hiroumi Tani, Kenta Maruyama, Fumitaka Urayama, Akihito Mori
Proceedings Volume 9143, 914348 (2014) https://doi.org/10.1117/12.2056009
KEYWORDS: Contamination, Space telescopes, Telescopes, Mirrors, Space operations, Contamination control, Molecules, Infrared radiation, Observatories, Aerospace engineering
Proceedings Article | 15 October 2012 Paper
Evaluation of bakeout effectiveness by optical measurement of a contaminated surface
Hiroshi Yokozawa, Susumu Baba, Eiji Miyazaki, Yugo Kimoto
Proceedings Volume 8492, 84920A (2012) https://doi.org/10.1117/12.929453
KEYWORDS: Absorbance, Absorption, Mirrors, Optical testing, Optical properties, Contamination, FT-IR spectroscopy, Temperature metrology, Silicon, Spectroscopy
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