In this paper, we present the results of the measurements obtained using atomic force microscopy (AFM). The subject of research were the reduced graphene oxides which were obtained by oxidation (in first step) of the graphites and thermally reduction (in the second step). The three types of graphites (flake, scale and synthetic) and three different method of oxidation were used in the measurements. The special attention was paid to the height and horizontal sizes of the obtained material. The results was analysed and relevant conclusions were drawn from them.
Three precursors of graphite were employed to synthesise graphite oxides (GrO) that are now routinely obtained by the oxidation of a precursor graphite. These oxidation samples exhibit highly broadened D and G Raman bands which caused by the large amount of defects of graphene sheets. In addition, chemical oxidation results in the multiple peaks such as G*, D+D` and 2D`(in place of the conventional 2D band), which are activated by defects. The broad G band might also be deconvoluted in the actual G band and D` band, thereby attributing the broadening in G band. The band position and intensity ratio have also been demonstrated in the oxidized graphite.