Sai Swaroop Yeddulapalli
at Texas A&M Univ.
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 29 April 2019
JM3 Vol. 18 Issue 02
KEYWORDS: Scanning electron microscopy, Neural networks, Line width roughness, Denoising, Line edge roughness, Machine learning, Monte Carlo methods, Computer simulations, Convolutional neural networks, Wavelets

Proceedings Article | 3 October 2018
Proc. SPIE. 10810, Photomask Technology 2018
KEYWORDS: Convolutional neural networks, Image processing, Scanning electron microscopy, Neural networks, Line width roughness, Machine learning, Line edge roughness, Stochastic processes

Proceedings Article | 19 September 2018
Proc. SPIE. 10775, 34th European Mask and Lithography Conference
KEYWORDS: Convolutional neural networks, Denoising, Scanning electron microscopy, Neural networks, Line width roughness, Machine learning, Line edge roughness, Stochastic processes

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