CONFERENCE PROCEEDINGS
Advanced Search
Dr. Sai Siva Gorthi
at Indian Institute of Science
SPIE Involvement:
Author
Publications (4)
SPIE Journal Paper | 1 June 2010
Investigation to realize a computationally efficient implementation of the high-order instantaneous-moments-based fringe analysis method
Sai Siva Gorthi, G. Rajshekhar, Pramod Rastogi
OE, Vol. 49, Issue 06, 065802, (June 2010) https://doi.org/10.1117/12.10.1117/1.3454376
KEYWORDS: Fringe analysis, Error analysis, Signal to noise ratio, Fourier transforms, Statistical analysis, Optical engineering, Digital holography, Holographic interferometry, Computer simulations, MATLAB
Proceedings Article | 5 September 2006 Paper
Novel composite coded pattern for small angle measurement using imaging method
Suguna Sree Nukala, Sai Siva Gorthi, Kameswara Rao Lolla
Proceedings Volume 6289, 62891D (2006) https://doi.org/10.1117/12.678792
KEYWORDS: Mirrors, Composites, Fourier transforms, CCD cameras, Phase measurement, Edge detection, Interferometry, Image processing, Image analysis, Cameras
Proceedings Article | 13 June 2005 Paper
Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry
Sai Siva Gorthi, Kameswara Lolla
Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612634
KEYWORDS: Wavelet transforms, Fringe analysis, Fourier transforms, Error analysis, Wavelets, Image processing, Computer simulations, 3D metrology, Shape analysis, Image analysis
Proceedings Article | 13 June 2005 Paper
A new approach for simple and rapid shape measurement of objects with surface discontinuities
Sai Siva Gorthi, Kameswara Rao Lolla
Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612620
KEYWORDS: Fringe analysis, Fourier transforms, Spatial frequencies, Profiling, MATLAB, Algorithm development, Spatial resolution, Reliability, RGB color model, Structured light
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top