Dr. Sameer K. Ajmera
Technical Program Manager at Leonardo DRS
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | May 31, 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Microbolometers, Oxides, Thin films, Germanium, X-ray diffraction, Silicon, Resistance, Oxygen, Silicon films, Temperature metrology

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Amorphous silicon, Bolometers, Packaging, Readout integrated circuits, Microbolometers, Capacitors, Sensors, Hydrogen, Resistance

PROCEEDINGS ARTICLE | July 28, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Amorphous silicon, Packaging, Readout integrated circuits, Capacitors, Sensors, Digital filtering, Infrared radiation, Electronic filtering, Semiconducting wafers

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Amorphous silicon, Microbolometers, Infrared sensors, Thin films, Sensors, Hydrogen, Resistance, Infrared radiation, Temperature metrology, Plasma

PROCEEDINGS ARTICLE | April 17, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Staring arrays, Amorphous silicon, Packaging, Microbolometers, Thermography, Capacitors, Digital filtering, Infrared radiation, Semiconducting wafers, Standard readout integrated circuits

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