Dr. Sami C. Antrazi
at 4Wave Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Microbolometers, Oxides, Vanadium, Thin films, Diffraction, Sputter deposition, Oxygen, Transmission electron microscopy, Ion beams, Nanocomposites

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Oxides, Vanadium, Infrared imaging, Thin films, Sputter deposition, Oxygen, Transmission electron microscopy, Raman spectroscopy, Ion beams, Nanocrystals

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top