Samuel Bucourt
CEO and President at Imagine Optic SA
Area of Expertise:
wavefront sensing , adaptive optics , optical metrology , deformable mirror , ultraintense laser , superresolution microscopy
Publications (10)

Proceedings Article | 14 May 2019
Proc. SPIE. 11036, Relativistic Plasma Waves and Particle Beams as Coherent and Incoherent Radiation Sources III
KEYWORDS: Metrology, Sensors, X-rays, X-ray sources, Wavefront sensors, Extreme ultraviolet, High harmonic generation, Hard x-rays, Free electron lasers, Ultrafast imaging

Proceedings Article | 13 May 2019
Proc. SPIE. 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Wavefront sensors, Wavefronts, Adaptive optics, Extreme ultraviolet, Optical alignment, Optics manufacturing

Proceedings Article | 2 October 2018
Proc. SPIE. 10761, Adaptive X-Ray Optics V
KEYWORDS: Monochromatic aberrations, Mirrors, X-ray optics, Sensors, X-rays, Wavefront sensors, Wavefronts, Adaptive optics, Extreme ultraviolet, EUV optics

Proceedings Article | 29 September 2010
Proc. SPIE. 7803, Adaptive X-Ray Optics
KEYWORDS: Actuators, Photovoltaics, Mirrors, X-ray optics, Metrology, X-rays, Wavefront sensors, Wavefronts, Deformable mirrors, Synchrotron radiation

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Metrology, Sensors, Calibration, Reflectivity, Wavefront sensors, Wavefronts, Gaussian filters, Semiconductor manufacturing, Semiconducting wafers, Chemical mechanical planarization

Proceedings Article | 1 October 2007
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Monochromatic aberrations, X-ray optics, Sensors, Calibration, Argon, X-rays, Wavefronts, Infrared radiation, Extreme ultraviolet, High harmonic generation

Showing 5 of 10 publications
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