Mr. Samuel J. M. Kuhr
Reserach Engineer at Univ of Dayton Research Institute
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | April 8, 2009
Proc. SPIE. 7295, Health Monitoring of Structural and Biological Systems 2009
KEYWORDS: Sensors, Electrodes, Ultrasonics, Optical inspection, Wave propagation, Transducers, Structural health monitoring, Wave sensors, Signal detection, Aircraft structures

PROCEEDINGS ARTICLE | April 7, 2009
Proc. SPIE. 7293, Smart Sensor Phenomena, Technology, Networks, and Systems 2009
KEYWORDS: Thin films, Foam, Aerospace engineering, Sensors, Error analysis, Ceramics, Composites, Data acquisition, Damage detection, Ferroelectric polymers

PROCEEDINGS ARTICLE | April 29, 2008
Proc. SPIE. 6935, Health Monitoring of Structural and Biological Systems 2008
KEYWORDS: Titanium, Digital photography, Imaging systems, Sensors, Resistance, Structural health monitoring, Optical interferometry, Laser damage threshold, Signal detection, Ferroelectric polymers

PROCEEDINGS ARTICLE | April 10, 2007
Proc. SPIE. 6530, Sensor Systems and Networks: Phenomena, Technology, and Applications for NDE and Health Monitoring 2007
KEYWORDS: Thin films, Foam, Imaging systems, Sensors, Ceramics, Composites, Nondestructive evaluation, Data acquisition, System integration, Ferroelectric polymers

PROCEEDINGS ARTICLE | July 22, 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Magnesium, Microscopy, Copper, Resistance, Heat treatments, Image analysis, Atomic force microscopy, Transmission electron microscopy, Aluminum, Photomicroscopy

PROCEEDINGS ARTICLE | July 22, 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Sensors, Calibration, Heat treatments, Magnetism, Nondestructive evaluation, Atomic force microscopy, Process control, Aluminum, Magnetic sensors, Temperature metrology

Showing 5 of 6 publications
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